New Family of PXI, PXIe and LXI Switched Guard Modules

Hi there,

We are excited to announce the release of our new family of switched guard modules. The low leakage switching solutions target very low current driven-guard measurements in semiconductor parametric test applications such as WAT (wafer acceptance testing). The cross-platform products include PXI, PXIe and LXI versions and are based on the switched guard design principle, with the overall designs assuring isolation resistances of up to 10¹³Ω.

New Relay Cycle Counting Tool

We have introduced a new tool to our range of Diagnostic Test Tools for Switching Systems: Our Relay Cycle Counting Tool. This is an advanced solution for monitoring the physical degradation of PXI cards and their internal components within a PXI or LXI chassis. By precisely tracking relay cycles, this tool proactively identifies wear and tear in heavily utilized electrical components, facilitating timely and preemptive maintenance scheduling.