Verification and diagnosis of complex switching operations in a test system have always been an issue. We recently announced our new Relay Cycle Counting Tool that proactively identifies wear and tear in heavily utilized electrical components, facilitating timely and preemptive maintenance scheduling.
In our new blog series, we discuss the pivotal role sensors play in ECU Validation. Learn about the different types of sensor simulation and best practices in Parts 1-5:
Switched Guard Matrices and Industrial Digital I/O Families
Our new family of Switched Guard Modules target low-leakage current measurement in semiconductor parametric testing. The cross-platform products include PXI, PXIe and LXI versions and are based on the switched guard design principle, with the overall designs assuring isolation resistances of up to 1013Ω.
We announced four new industrial digital I/O families for PXI- and LXI-based systems. Expanding our range of industrial digital input and output modules, these four families deliver higher density, expanded voltage and current ranges, and programmable logic levels – all in both PXI and PXIe form factors.
Webinar
The Impact of MEMS-based RF Multiplexers for Next-Generation Test Systems
We joined forces with Menlo Microsystems to bring to market a series of ground-breaking RF Multiplexer products – the first to incorporate the unique MEMS Ideal Switch technology. In this webinar, we discuss our long-term collaboration to innovate next-generation microwave switch design, addressing some of the key limitations and tradeoffs between performance, reliability, form factor, and overall cost of test.
Did you hear? We have a LinkedIn Newsletter
We recently started promoting our LinkedIn eNewsletter Series: Electronic Test Spotlight. This is where we will be promoting our monthly updates including new product announcements, company news and updates, new resources, and more.
Have questions about our modular switching and sensor simulation solutions? Contact us or just reply to this email, and we would be happy to answer them.
