Check out our white paper: 

It is best practice when automating test within a manufacturing process to consider interconnection as an extension of the test instrument. Test engineers need to take care of the whole measurement channel by considering everything between the instrument and the DUT, including cables, switching subsystems, connectors and mass interconnect products. 

This white paper will explore potential issues in production between a device under test (DUT) and the test instruments, focusing on how path resistance, line capacitance and insertion loss affect test results, and what can be done to minimize their impact. 

Details include:

• Objectives of a successful automated test system
• Journey of a test signal
• Roadblocks
• Designing custom cables

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