New Switching Solutions to be Introduced at IEEE AUTOTESTCON

Below are the newest additions to our switching solution lineup.

First up:
PXI 5 Amp Solid State Multiplexer

This new range of PXI multiplexers (model 40-652) was originally designed for a large defense contractor. The contractor was looking for a multiplexer that could handle large inrush currents—after working with our design team, this new multiplexer module was developed. The 40-652 series offers a range of configurations suitable for hot or cold switching signals up to ±100V at 5A. The use of solid state relays allows the hot switching of signals without any life degradation, including DC signals that EMR (Electro-Mechanical Relay) designs can only handle with much-reduced service life and power handling.

This new design is capable of switching inductive loads up to a stored energy of 20mJ and is capable of withstanding 30A inrush currents for 300 µs when switching capacitive loads. The multiplexer module is available in single pole 48:1, two pole 24:1, single pole dual 24:1 or single pole 24:1 configurations.

The use of solid state relays also ensures a fast, typical operating time of 85us making it ideal for use in applications where the speed of test is critical.

These multiplexers are also supported by our eBIRST switching system test tools; these tools provide an easy to use solution for quickly identify faulty switching systems.

Next up:
Modular Breakout System for Hardware-in-the-Loop Applications

In partnership with OPAL-RT Technologies , we have designed this low-cost Modular Breakout System. The beauty of this breakout system is that it combines a BoB feature set with added flexibility and an FIU chassis. By mating the FIU chassis directly to the BoB, cabling is minimized, creating a more compact reliable design and improving signal integrity. All cables to the simulation system and the UUT are located behind the front panel of the Module Breakout System creating a simpler front panel that is less prone to damage.

If you are familiar with traditional Hardware-in-the-Loop (HIL) simulation testing, you know that it features signal switching for the purpose of injecting faults into a Unit Under Test (UUT). In order to make manual measurements and induce a fault manually prior to writing test code, a Breakout Box (BoB) needs to be added. Unfortunately, the majority of the BoBs and FIU systems available today are not modular and are fixed in configuration, creating a test solution that is not often ideal. Additionally, they have cable configurations that are cumbersome and in many cases expensive. 

Want to see these products up close and personal? We will be showcasing these at IEEE AUTOTESTCON in Booth 203 along with our many of our other PXI, PCI and LXI switching solutions.  Stop by and take a look.

Not heading to AUTOTESTCON?.